An Efficient Degraded Deductive Fault Simulator for Small-Delay Defects
Sign Up to like & getrecommendations! Published in 2020 at "IEEE Access"
DOI: 10.1109/access.2020.3037292
Abstract: An efficient degraded deductive simulator for small delay defects is proposed. The proposed method takes into account the conditions of re-convergence sensitization and hazard-based detection, providing fast and accurate simulation results for small delay defects.… read more here.
Keywords: delay defects; degraded deductive; small delay; simulator ... See more keywords
Longest Path Selection Based on Path Identifiers
Sign Up to like & getrecommendations! Published in 2024 at "IEEE Access"
DOI: 10.1109/access.2024.3357754
Abstract: A small delay defect adds a small extra delay to the propagation time of a signal through a gate or line. Small delay defects can occur during fabrication or during the lifetime of a chip.… read more here.
Keywords: longest path; integer; delay defects; small delay ... See more keywords
Two-Step Unbiased Estimation on Small-Delay Multipath of GNSS Signals Based on S-Curve Bias
Sign Up to like & getrecommendations! Published in 2023 at "IEEE Transactions on Instrumentation and Measurement"
DOI: 10.1109/tim.2022.3232801
Abstract: Multipath error is among the main error sources of global navigation satellite systems (GNSSs). The traditional estimation method represented by the multipath estimating delay-locked loop (MEDLL) has difficulty in distinguishing small-delay multipath signals and noise… read more here.
Keywords: small delay; delay multipath; multipath; multipath signals ... See more keywords
Built-In Self-Repair of Small Delay Faults Occurring to TSVs in a 3D-DRAM Using an Enhanced Pulse-Vanishing Test
Sign Up to like & getrecommendations! Published in 2025 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"
DOI: 10.1109/tvlsi.2024.3514732
Abstract: In a 3D-DRAM, multiple DRAM dice are stacked together and bonded vertically with through-silicon vias (TSVs). It is known that a 3D-DRAM could operate at a very high speed, and even a small delay fault… read more here.
Keywords: dram; repair; test; small delay ... See more keywords