A quantitative method for measuring small residual beam tilts in high-resolution transmission electron microscopy.
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DOI: 10.1016/j.ultramic.2017.10.005
Abstract: In a transmission electron microscope, electron illumination beam tilt, or the degree of deviation of electron beam from its optical axis, is an important parameter that has a significant impact on image contrast and image… read more here.
Keywords: microscopy; small residual; measuring small; beam tilts ... See more keywords