Surface optical characterization at nanoscale using phasor representation of data acquired by scattering scanning near-field optical microscopy
Sign Up to like & getrecommendations! Published in 2020 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2020.145347
Abstract: Abstract Placed at the junction of laser-scanning and probe-scanning techniques, scattering scanning near-field optical microscopy (s-SNOM) is a promising tool for the optical investigation of surfaces at nanoscale resolution. In this work we expand the… read more here.
Keywords: scattering scanning; microscopy; snom; phasor representation ... See more keywords
Probes for Ultrasensitive THz Nanoscopy
Sign Up to like & getrecommendations! Published in 2019 at "ACS Photonics"
DOI: 10.1021/acsphotonics.9b00324
Abstract: Scattering-type scanning near-field microscopy (s-SNOM) at terahertz (THz) frequencies could become a highly valuable tool for studying a variety of phenomena of both fundamental and applied interest, including mobile carrier excitations or phase transitions in… read more here.
Keywords: thz; snom; afm tips; ultrasensitive thz ... See more keywords
Mapping three-dimensional near-field responses with reconstruction scattering-type scanning near-field optical microscopy
Sign Up to like & getrecommendations! Published in 2017 at "AIP Advances"
DOI: 10.1063/1.4984924
Abstract: Scattering-type scanning near-field optical microscopy (s-SNOM) enables mapping of nanoscale field distributions in two dimensions. However, the standard s-SNOM technique lacks direct resolving ability along the vertical direction, therefore unable to provide full three-dimensional near-field… read more here.
Keywords: three dimensional; microscopy; snom; field ... See more keywords