AFM-IR and IR-SNOM for the Characterization of Small Molecule Organic Semiconductors
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DOI: 10.1021/acs.jpcc.9b11056
Abstract: Vibrational spectroscopies, such as Raman and Fourier-transform infrared spectroscopy (FT-IR), are powerful tools for the characterization of organic semiconductor thin films and crystals in additi... read more here.
Keywords: afm snom; snom characterization; small molecule; molecule organic ... See more keywords