Articles with "soft error" as a keyword



Soft Error Tolerant Count Min Sketches

Sign Up to like & get
recommendations!
Published in 2021 at "IEEE Transactions on Computers"

DOI: 10.1109/tc.2020.2987890

Abstract: The estimation of the frequency of the elements on a set is needed in a wide range of computing applications. For example, to estimate the number of hits that a video gets or the number… read more here.

Keywords: number; memory; soft error; count min ... See more keywords

A Method to Detect Bit Flips in a Soft-Error Resilient TCAM

Sign Up to like & get
recommendations!
Published in 2018 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"

DOI: 10.1109/tcad.2017.2748019

Abstract: Ternary content addressable memories (TCAMs) are special memories which are widely used in high-speed network applications such as routers, firewalls, and network address translators. In high-reliability network applications such as aerospace and defense systems, soft-error… read more here.

Keywords: tcam; bit; soft error; tex math ... See more keywords

Online Resource Management for Improving Reliability of Real-Time Systems on “Big–Little” Type MPSoCs

Sign Up to like & get
recommendations!
Published in 2020 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"

DOI: 10.1109/tcad.2018.2883990

Abstract: Heterogeneous multiprocessor systems on a chips (MPSoCs) consisting of cores with different performance/power characteristics are widely used in many real-time embedded systems, where both soft-error reliability and lifetime reliability are key concerns. Although existing efforts… read more here.

Keywords: time; real time; soft error; time systems ... See more keywords

Resource Management for Improving Soft-Error and Lifetime Reliability of Real-Time MPSoCs

Sign Up to like & get
recommendations!
Published in 2019 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"

DOI: 10.1109/tcad.2018.2883993

Abstract: Multiprocessor system-on-chip (MPSoC) has been widely used in many real-time embedded systems where both soft-error reliability (SER) and lifetime reliability (LTR) are key concerns. Many existing works have investigated them, but they focus either on… read more here.

Keywords: real time; soft error; time mpsocs; lifetime reliability ... See more keywords

Soft-Error-Immune Read-Stability-Improved SRAM for Multi-Node Upset Tolerance in Space Applications

Sign Up to like & get
recommendations!
Published in 2021 at "IEEE Transactions on Circuits and Systems I: Regular Papers"

DOI: 10.1109/tcsi.2021.3085516

Abstract: With aggressive scaling of transistor size and supply voltage, the critical charge of the sensitive nodes is reducing rapidly. As a result, when these deep submicron devices are used in memory cells in the space… read more here.

Keywords: error immune; immune read; read stability; soft error ... See more keywords

Applying Lightweight Soft Error Mitigation Techniques to Embedded Mixed Precision Deep Neural Networks

Sign Up to like & get
recommendations!
Published in 2021 at "IEEE Transactions on Circuits and Systems I: Regular Papers"

DOI: 10.1109/tcsi.2021.3097981

Abstract: Deep neural networks (DNNs) are being incorporated in resource-constrained IoT devices, which typically rely on reduced memory footprint and low-performance processors. While DNNs’ precision and performance can vary and are essential, it is also vital… read more here.

Keywords: deep neural; neural networks; soft error; reliability ... See more keywords

Design of Robust SRAM Cell With Enhanced Soft-Error Hardening for Radiation-Prone Applications

Sign Up to like & get
recommendations!
Published in 2025 at "IEEE Transactions on Device and Materials Reliability"

DOI: 10.1109/tdmr.2025.3609912

Abstract: This paper presents a 14-transistor soft-error-hardened SRAM cell (SEH-14T) designed to ensure robust performance in high-radiation environment. The proposed design enhances error tolerance by strategically delaying or impeding the fault propagation following error occurrences at… read more here.

Keywords: soft error; radiation; cell; sram cell ... See more keywords

sETNM: Soft-Error-Tolerant Nonvolatile MRAM for Space Applications

Sign Up to like & get
recommendations!
Published in 2025 at "IEEE Transactions on Nanotechnology"

DOI: 10.1109/tnano.2025.3617228

Abstract: Static random access memory (SRAM) is widely used for its infinite configurability and high performance. However, magnetic RAM (MRAM) is gaining importance in the industry due to its zero leakage, non-volatility, and high radiation reliability.… read more here.

Keywords: tolerant nonvolatile; soft error; space; radiation ... See more keywords

Energy-Resolved Soft-Error Rate Measurements for 1–800 MeV Neutrons by the Time-of-Flight Technique at LANSCE

Sign Up to like & get
recommendations!
Published in 2020 at "IEEE Transactions on Nuclear Science"

DOI: 10.1109/tns.2020.3025727

Abstract: Problems caused by neutron-induced soft errors in electrical devices are becoming increasingly common in various applications. The neutron-energy-dependent soft-error rate is indispensable for evaluating the frequency of such errors in different neutron fields. We have… read more here.

Keywords: soft error; error rate; error; energy ... See more keywords

0.1–10 MeV Neutron Soft Error Rate in Accelerator and Atmospheric Environments

Sign Up to like & get
recommendations!
Published in 2021 at "IEEE Transactions on Nuclear Science"

DOI: 10.1109/tns.2021.3064666

Abstract: Neutrons with energies between 0.1 and 10 MeV can significantly impact the soft error rate (SER) in SRAMs manufactured in scaled technologies, with respect to high-energy neutrons. Their contribution is evaluated in accelerator, ground-level, and… read more here.

Keywords: rate accelerator; error rate; soft error; rate ... See more keywords

Partial TMR for Improving the Soft Error Reliability of SRAM-Based FPGA Designs

Sign Up to like & get
recommendations!
Published in 2021 at "IEEE Transactions on Nuclear Science"

DOI: 10.1109/tns.2021.3070856

Abstract: Triple modular redundancy (TMR) is a single-event upset (SEU)-mitigation technique that uses three circuit copies to mask a failure in any one copy. It improves the soft error reliability of designs implemented on SRAM-based field-programmable… read more here.

Keywords: soft error; error reliability; error; sram based ... See more keywords