Articles with "soft error" as a keyword



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Soft Error Tolerant Count Min Sketches

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Published in 2021 at "IEEE Transactions on Computers"

DOI: 10.1109/tc.2020.2987890

Abstract: The estimation of the frequency of the elements on a set is needed in a wide range of computing applications. For example, to estimate the number of hits that a video gets or the number… read more here.

Keywords: number; memory; soft error; count min ... See more keywords
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A Method to Detect Bit Flips in a Soft-Error Resilient TCAM

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Published in 2018 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"

DOI: 10.1109/tcad.2017.2748019

Abstract: Ternary content addressable memories (TCAMs) are special memories which are widely used in high-speed network applications such as routers, firewalls, and network address translators. In high-reliability network applications such as aerospace and defense systems, soft-error… read more here.

Keywords: tcam; bit; soft error; tex math ... See more keywords
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Online Resource Management for Improving Reliability of Real-Time Systems on “Big–Little” Type MPSoCs

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Published in 2020 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"

DOI: 10.1109/tcad.2018.2883990

Abstract: Heterogeneous multiprocessor systems on a chips (MPSoCs) consisting of cores with different performance/power characteristics are widely used in many real-time embedded systems, where both soft-error reliability and lifetime reliability are key concerns. Although existing efforts… read more here.

Keywords: time; real time; soft error; time systems ... See more keywords
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Resource Management for Improving Soft-Error and Lifetime Reliability of Real-Time MPSoCs

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Published in 2019 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"

DOI: 10.1109/tcad.2018.2883993

Abstract: Multiprocessor system-on-chip (MPSoC) has been widely used in many real-time embedded systems where both soft-error reliability (SER) and lifetime reliability (LTR) are key concerns. Many existing works have investigated them, but they focus either on… read more here.

Keywords: real time; soft error; time mpsocs; lifetime reliability ... See more keywords
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Soft-Error-Immune Read-Stability-Improved SRAM for Multi-Node Upset Tolerance in Space Applications

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Published in 2021 at "IEEE Transactions on Circuits and Systems I: Regular Papers"

DOI: 10.1109/tcsi.2021.3085516

Abstract: With aggressive scaling of transistor size and supply voltage, the critical charge of the sensitive nodes is reducing rapidly. As a result, when these deep submicron devices are used in memory cells in the space… read more here.

Keywords: error immune; immune read; read stability; soft error ... See more keywords
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Applying Lightweight Soft Error Mitigation Techniques to Embedded Mixed Precision Deep Neural Networks

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Published in 2021 at "IEEE Transactions on Circuits and Systems I: Regular Papers"

DOI: 10.1109/tcsi.2021.3097981

Abstract: Deep neural networks (DNNs) are being incorporated in resource-constrained IoT devices, which typically rely on reduced memory footprint and low-performance processors. While DNNs’ precision and performance can vary and are essential, it is also vital… read more here.

Keywords: deep neural; neural networks; soft error; reliability ... See more keywords
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Energy-Resolved Soft-Error Rate Measurements for 1–800 MeV Neutrons by the Time-of-Flight Technique at LANSCE

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Published in 2020 at "IEEE Transactions on Nuclear Science"

DOI: 10.1109/tns.2020.3025727

Abstract: Problems caused by neutron-induced soft errors in electrical devices are becoming increasingly common in various applications. The neutron-energy-dependent soft-error rate is indispensable for evaluating the frequency of such errors in different neutron fields. We have… read more here.

Keywords: soft error; error rate; error; energy ... See more keywords
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0.1–10 MeV Neutron Soft Error Rate in Accelerator and Atmospheric Environments

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Published in 2021 at "IEEE Transactions on Nuclear Science"

DOI: 10.1109/tns.2021.3064666

Abstract: Neutrons with energies between 0.1 and 10 MeV can significantly impact the soft error rate (SER) in SRAMs manufactured in scaled technologies, with respect to high-energy neutrons. Their contribution is evaluated in accelerator, ground-level, and… read more here.

Keywords: rate accelerator; error rate; soft error; rate ... See more keywords
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Partial TMR for Improving the Soft Error Reliability of SRAM-Based FPGA Designs

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Published in 2021 at "IEEE Transactions on Nuclear Science"

DOI: 10.1109/tns.2021.3070856

Abstract: Triple modular redundancy (TMR) is a single-event upset (SEU)-mitigation technique that uses three circuit copies to mask a failure in any one copy. It improves the soft error reliability of designs implemented on SRAM-based field-programmable… read more here.

Keywords: soft error; error reliability; error; sram based ... See more keywords
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Intrinsic Vulnerability to Soft Errors and a Mitigation Technique by Layout Optimization on DICE Flip Flops in a 65-nm Bulk Process

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Published in 2021 at "IEEE Transactions on Nuclear Science"

DOI: 10.1109/tns.2021.3075176

Abstract: We found that specific pairs of pMOS and nMOS transistors in dual interlocked storage cell flip flop (DICEFF) become sensitive to soft errors by device simulations. We propose several layout structures that can improve soft-error… read more here.

Keywords: tex math; inline formula; error tolerance; soft error ... See more keywords
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Soft Error Rate Reduction of Combinational Circuits Using Gate Sizing in the Presence of Process Variations

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Published in 2017 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"

DOI: 10.1109/tvlsi.2016.2569562

Abstract: Soft errors in combinational logic circuits are emerging as a significant reliability concern for nanoscale VLSI designs. This paper presents a novel sensitivity-based gate sizing methodology to reduce the soft error rate (SER) of combinational… read more here.

Keywords: reduction; methodology; gate; error rate ... See more keywords