Modelling of degradation and a soft failure moment during the operation of a supercapacitor applying selected diffusion processes
Sign Up to like & getrecommendations! Published in 2017 at "Engineering Failure Analysis"
DOI: 10.1016/j.engfailanal.2017.04.019
Abstract: Abstract An important requirement imposed on storage batteries nowadays is to have sufficient capacity. At the same time a high level of availability, reliability and safety is required as well. Our intention is to determine… read more here.
Keywords: degradation; moment; supercapacitor; soft failure ... See more keywords
Dual-Stage Soft Failure Detection and Identification for Low-Margin Elastic Optical Network by Exploiting Digital Spectrum Information
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DOI: 10.1109/jlt.2019.2947562
Abstract: Supported by advanced digital signal processing algorithms and application specific integrated circuits, coherent receivers in elastic optical networks will be capable of measuring link impairments in real time. Specifically, coherent receivers can work as soft… read more here.
Keywords: digital spectrum; spectrum; identification; detection ... See more keywords
Digital Residual Spectrum-Based Generalized Soft Failure Detection and Identification in Optical Networks
Sign Up to like & getrecommendations! Published in 2023 at "IEEE Transactions on Communications"
DOI: 10.1109/tcomm.2022.3222519
Abstract: Machine learning is regarded as an attractive solution for soft failure management in optical networks; however, the performance of trained models working on unseen data is of growing concern, due to scarce historical data and… read more here.
Keywords: residual spectrum; soft failure; digital residual; identification ... See more keywords
A Systematic Method to Characterize the Soft-Failure Susceptibility of the I/Os on an Integrated Circuit Due to Electrostatic Discharge
Sign Up to like & getrecommendations! Published in 2020 at "IEEE Transactions on Electromagnetic Compatibility"
DOI: 10.1109/temc.2018.2890704
Abstract: In this paper, we present a methodology to characterize the I/O pins of a logic IC such as an application processor or ASIC with respect to soft-failure susceptibility due to electrostatic discharge. With the IC… read more here.
Keywords: due electrostatic; methodology; failure susceptibility; electrostatic discharge ... See more keywords