IC Pin Modeling and Mitigation of ESD-Induced Soft Failures
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DOI: 10.1109/temc.2020.3011544
Abstract: In this article, electrostatic discharge (ESD) induced soft failures (SFs) of a USB3 Gen1 device are investigated by direct transmission line pulse injection with varying pulsewidth, amplitude, and polarity to characterize the failure behavior of… read more here.
Keywords: induced soft; soft failures; esd induced; mitigation ... See more keywords