A study on effects of total ionizing dose on hot carrier effect of PD I/O SOI PMOSFETs
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DOI: 10.1016/j.rinp.2019.102223
Abstract: Abstract The hot carrier injection (HCI) effect induced degradation is investigated for gamma ray irradiated PD I/O SOI PMOSFETs with T-shaped gate and H-shaped gate. Radiation enhanced effect on degradation during hot carrier stress is… read more here.
Keywords: hot carrier; soi pmosfets; study effects; gate ... See more keywords