Low Energy Proton SEUs in 32-nm SOI SRAMs at Low Vdd
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DOI: 10.1109/tns.2017.2659382
Abstract: Near-threshold computing and scaling are combined to operate SRAMs in regions where they are close to being unstable. One consequence of this is an increase in single event upsets (SEUs), due to the minimal charge… read more here.
Keywords: energy; seus soi; energy proton; soi srams ... See more keywords