Comparison of On-Wafer TRL Calibration to ISS SOLT Calibration With Open-Short De-Embedding up to 500 GHz
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DOI: 10.1109/tthz.2018.2884612
Abstract: Sub-mm circuit design requires accurate on-wafer characterization of passive and active devices. In industry, characterization of these devices is often performed with off-wafer short-open-load-thru (SOLT) calibration. In this paper, the validity of this characterization procedure… read more here.
Keywords: calibration; wafer calibration; characterization; wafer ... See more keywords