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Published in 2018 at "Journal of Applied Physics"
DOI: 10.1063/1.5019325
Abstract: The exceptionally large thermal strain in few-micrometers-thick 3C-SiC films on Si(111), causing severe wafer bending and cracking, is demonstrated to be elastically quenched by substrate patterning in finite arrays of Si micro-pillars, sufficiently large in…
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Keywords:
thermal bowing;
critical thermal;
aspect ratio;
sic 111 ... See more keywords