Articles with "source drain" as a keyword



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A source/drain-on-insulator structure to improve the performance of stacked nanosheet field-effect transistors

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Published in 2020 at "Journal of Computational Electronics"

DOI: 10.1007/s10825-020-01502-9

Abstract: For continued scaling with silicon, the stacked nanosheet field-effect transistor (SNSH-FET) is considered to be a major candidate for sub-7-nm technology. The radiofrequency (RF)/analog performance of a three-channel SNSH-FET is studied herein and benchmarked against… read more here.

Keywords: source drain; source; field effect; snsh fet ... See more keywords
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Work Function Tuning and Doping Optimization of 22-nm HKMG Raised SiGe/SiC Source–Drain FinFETs

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Published in 2017 at "Journal of Electronic Materials"

DOI: 10.1007/s11664-016-5199-5

Abstract: The basic requirements on process design of extremely scaled devices involve appropriate work function and tight doping control due to their significant effect on the threshold voltage as well as other critical electrical parameters such… read more here.

Keywords: work function; function; source drain; metal gate ... See more keywords
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Effects of source/drain elevation and side spacer dielectric on drivability performance of non-abrupt ultra shallow junction gate underlap GAA MOSFETs

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Published in 2018 at "Indian Journal of Physics"

DOI: 10.1007/s12648-017-1091-2

Abstract: Present work focuses on quantitative effects of source/drain elevation height ($${\text{h}}_{\text{SD}}$$hSD) and side spacer dielectric material (Air, SiO2, Si3N4 and HfO2) on the current drive of non-abrupt ultra shallow junction (USJ) gate all around (GAA)… read more here.

Keywords: text text; drain elevation; side spacer; source drain ... See more keywords
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Source-drain Resistance Characteristics of Back-channel Etched Amorphous InGaZnO Thin Film Transistors with TiO 2 :Nb Protective Layer

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Published in 2017 at "Materials Science in Semiconductor Processing"

DOI: 10.1016/j.mssp.2017.04.020

Abstract: Abstract This work investigates the source-drain (S-D) parasitic resistance (RSD) characteristics of the back-channel-etched (BCE) a-IGZO TFTs with ultra-thin Nb doped TiO2 (TNO) protective layer. It is shown that RSD is strongly related to the… read more here.

Keywords: tno; layer; source drain; characteristics back ... See more keywords
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Effects of high in-situ source/drain boron doping in p-FinFETs on physical and device performance characteristics

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Published in 2018 at "Materials Science in Semiconductor Processing"

DOI: 10.1016/j.mssp.2018.03.007

Abstract: Abstract In this study, the effects of high in-situ boron (B) doping in embedded source/drain (S/D) silicon germanium (SiGe) stressor of p-channel Fin Field Effect Transistors (FinFETs) in a 14 nm technology node were investigated. The… read more here.

Keywords: effects high; high situ; boron doping; spectroscopy ... See more keywords
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Bottom-contact organic thin film transistors with transparent Ga-doped ZnO source-drain electrodes

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Published in 2019 at "Materials Science in Semiconductor Processing"

DOI: 10.1016/j.mssp.2019.05.023

Abstract: Abstract In this study, transparent Ga-doped ZnO (GZO) films grown by magnetron sputtering were used as the source-drain (S-D) electrodes of bottom-contact organic field effect transistors (OTFTs). The GZO films exhibited good transmittance (beyond 80… read more here.

Keywords: bottom contact; gzo films; transparent doped; drain electrodes ... See more keywords
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Investigation of the source-drain electrodes/the active layer contact-effect on the performance of organic phototransistor

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Published in 2017 at "Synthetic Metals"

DOI: 10.1016/j.synthmet.2017.09.006

Abstract: Abstract In order to clarify the influence of the source/drain (S/D) electrodes/the active layer contact condition on the photoelectric properties of the organic phototransistor (OPT), pentacene (Pn) and copper phthalocyanine (CuPc) based OPTs with Au… read more here.

Keywords: electrodes active; source drain; drain electrodes; active layer ... See more keywords
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Enhanced Organic Thin-Film Transistor Stability by Preventing MoO3 Diffusion with Metal/MoO3/Organic Multilayered Interface Source-Drain Contact.

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Published in 2022 at "ACS applied materials & interfaces"

DOI: 10.1021/acsami.2c18780

Abstract: The source-drain electrode with a MoO3 interfacial modification layer (IML) is considered the most promising method to solve electrical contact issues impeding organic thin-film transistors (OTFTs) from commercialization. However, this method raises many concerns because… read more here.

Keywords: contact; diffusion; source drain; moo3 diffusion ... See more keywords
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Unraveling the Issue of Ag Migration in Printable Source/Drain Electrodes Compatible with Versatile Solution-Processed Oxide Semiconductors for Printed Thin-Film Transistor Applications.

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Published in 2017 at "ACS applied materials & interfaces"

DOI: 10.1021/acsami.7b00524

Abstract: In recent decades, solution-processable, printable oxide thin-film transistors have garnered a tremendous amount of attention given their potential for use in low-cost, large-area electronics. However, printable metallic source/drain electrodes undergo undesirable electrical/thermal migration at an… read more here.

Keywords: thin film; drain electrodes; migration; solution ... See more keywords
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High polarization sensitivity in tungsten telluride photodetector under zero source-drain bias voltage

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Published in 2021 at "Journal of Physics D: Applied Physics"

DOI: 10.1088/1361-6463/ac0ca0

Abstract: Using first-principles calculations, we investigate the photogalvanic effect (PGE) in photodetectors based on tungsten telluride/molybdenum telluride (WTe2/MoTe2) heterostructures. Our calculations reveal that the photocurrent generated by the PGE exhibits a highly asymmetric response along the… read more here.

Keywords: photodetector; tungsten telluride; polarization; source drain ... See more keywords
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Transport collapse in dynamically evolving networks

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Published in 2023 at "Journal of the Royal Society Interface"

DOI: 10.1098/rsif.2022.0906

Abstract: Transport in complex networks can describe a variety of natural and human-engineered processes including biological, societal and technological ones. However, how the properties of the source and drain nodes can affect transport subject to random… read more here.

Keywords: collapse; scale free; transport; source drain ... See more keywords