Facile sample preparation method allowing TEM characterization of the stacking structures and interlayer spaces of clay minerals
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DOI: 10.1016/j.clay.2019.01.019
Abstract: Abstract Transmission electron microscopy (TEM) is an essential and irreplaceable technique for studying the micromorphology and microstructure of clay minerals. However, observing layer stacking and detecting the interlayer spaces of clay minerals by TEM are… read more here.
Keywords: interlayer spaces; method; clay minerals; tem characterization ... See more keywords