Sparse Emission Source Microscopy for Rapid Emission Source Imaging
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DOI: 10.1109/temc.2016.2639526
Abstract: Emission source microscopy (ESM) technique can be utilized for the localization of electromagnetic interference sources in complex and large systems. This paper presents a sparse and nonuniform sampling technique for ESM. Compared with the traditional… read more here.
Keywords: microscopy; emission source; sparse emission; source microscopy ... See more keywords