Extraction of medium-spatial-frequency interfacial waviness and inner structure from X-ray multilayers using the speckle scanning technique
Sign Up to like & getrecommendations! Published in 2019 at "Optical Materials Express"
DOI: 10.1364/ome.9.002878
Abstract: In this work, quick imaging measurements at different X-ray penetration depths, including the total-reflection region and Bragg reflection angles, were used to characterize the X-ray multilayer inner structure. We then measured the interface replication factor,… read more here.
Keywords: inner structure; medium spatial; spatial frequency; speckle scanning ... See more keywords