Cleaved-edge photoluminescence spectroscopy of multilayer heterostructures
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DOI: 10.1134/s1063782617110239
Abstract: The capabilities of a technique based on combined photoluminescence and Raman-spectroscopy measurements upon lateral scanning across the cleaved edge of heterostructures for monitoring the strain profile and the thickness of epitaxial layers are demonstrated. The… read more here.
Keywords: cleaved edge; photoluminescence spectroscopy; spectroscopy multilayer; spectroscopy ... See more keywords