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Published in 2024 at "ACS applied materials & interfaces"
DOI: 10.1021/acsami.4c01189
Abstract: We investigated low-frequency current fluctuations, i.e., electronic noise, in FePS3 van der Waals layered antiferromagnetic semiconductor. The noise measurements have been used as noise spectroscopy for advanced materials characterization of the charge carrier dynamics affected…
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Keywords:
spectroscopy;
noise spectroscopy;
spectroscopy quasi;
antiferromagnetic semiconductors ... See more keywords