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Published in 2025 at "Journal of Microscopy"
DOI: 10.1111/jmi.13422
Abstract: In the field of atomic force microscopy (AFM), image quality is frequently compromised by distortions that impact measurement precision. These distortions are caused by a combination of factors such as the hysteresis, creep, and drift…
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Keywords:
method;
scanning path;
image;
spiral scanning ... See more keywords
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Published in 2024 at "Micromachines"
DOI: 10.3390/mi15091154
Abstract: Magnetorheological finishing (MRF) of aspherical optical elements usually requires the coordination between the translational axes and the oscillating axes of the machine tool to realize the processing. For aspheric optical elements whose steepness exceeds the…
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Keywords:
optical element;
spiral scanning;
optical elements;
scanning path ... See more keywords