Effect of Au-Coating on the Laser Spot Cutting on Spring Contact Probe (SCP) for Semi-Conductor Inspection
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DOI: 10.3390/ma14123300
Abstract: Spring contact probes (SCPs) are used to make contact with various test points on printed circuit boards (PCBs), wire harnesses, and connectors. Moreover, they can consist of the test interface between the PCBs and the… read more here.
Keywords: scp; laser; laser spot; contact ... See more keywords