Analytic function to describe interfaces and resolution consistency in sputter depth profiling
Sign Up to like & getrecommendations! Published in 2018 at "Surface and Interface Analysis"
DOI: 10.1002/sia.6347
Abstract: A simple analytical function is derived to describe the interface shapes measured in sputter depth profiling using XPS or SIMS. This function involves the convolution of a central Gaussian function, often taken to describe the… read more here.
Keywords: resolution; depth profiling; describe; function ... See more keywords
Peak position differences observed during XPS sputter depth profiling of the SEI on lithiated and delithiated carbon-based anode material for Li-ion batteries
Sign Up to like & getrecommendations! Published in 2017 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2016.12.223
Abstract: Abstract The ability of delivering chemical information from peak shift phenomena has ever since made X-ray photoelectron spectroscopy (XPS) an ideal tool for material characterization in Li-ion batteries (LIB). Upon investigation, charging is inevitable as… read more here.
Keywords: depth profiling; ion; ion batteries; sputter depth ... See more keywords
ToF-SIMS sputter depth profiling of interphases and coatings on lithium metal surfaces
Sign Up to like & getrecommendations! Published in 2025 at "Communications Chemistry"
DOI: 10.1038/s42004-025-01426-0
Abstract: Lithium metal as a negative electrode material offers ten times the specific capacity of graphitic electrodes, but its rechargeable operation poses challenges like excessive and continuous interphase formation, high surface area lithium deposits and safety… read more here.
Keywords: lithium; tof sims; lithium metal; sims sputter ... See more keywords