Analytic function to describe interfaces and resolution consistency in sputter depth profiling
Sign Up to like & getrecommendations! Published in 2018 at "Surface and Interface Analysis"
DOI: 10.1002/sia.6347
Abstract: A simple analytical function is derived to describe the interface shapes measured in sputter depth profiling using XPS or SIMS. This function involves the convolution of a central Gaussian function, often taken to describe the… read more here.
Keywords: resolution; depth profiling; describe; function ... See more keywords
Peak position differences observed during XPS sputter depth profiling of the SEI on lithiated and delithiated carbon-based anode material for Li-ion batteries
Sign Up to like & getrecommendations! Published in 2017 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2016.12.223
Abstract: Abstract The ability of delivering chemical information from peak shift phenomena has ever since made X-ray photoelectron spectroscopy (XPS) an ideal tool for material characterization in Li-ion batteries (LIB). Upon investigation, charging is inevitable as… read more here.
Keywords: depth profiling; ion; ion batteries; sputter depth ... See more keywords