Reliability enhancement due to in-situ post-oxidation of sputtered MgO barrier in double MgO barrier magnetic tunnel junction
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DOI: 10.1063/1.4985300
Abstract: We have investigated the effects of in-situ post-oxidation (PO) of a sputtered MgO barrier in a double-MgO-barrier magnetic tunnel junction (MTJ) and found that the short error rate was significantly reduced, the magnetoresistance (MR) ratio… read more here.
Keywords: mgo barrier; post oxidation; situ post; barrier ... See more keywords