Surface characterizations of TiH2 powders before and after dehydrogenation
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DOI: 10.1016/j.apsusc.2017.03.077
Abstract: Abstract The oxide film of TiH2 and HDH-Ti powder are investigated using X-ray photoelectron spectroscopy (XPS). The XPS depth profiles indicate that there exists mainly Ti2+, Ti3+, Ti4+ and Ti0 on TiH2 and HDH-Ti surface.… read more here.
Keywords: hdh; surface; sputtering depth; tih2 hdh ... See more keywords
Depth resolution and preferential sputtering in depth profiling of sharp interfaces
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DOI: 10.1016/j.apsusc.2017.03.110
Abstract: Abstract The influence of preferential sputtering on depth resolution of sputter depth profiles is studied for different sputtering rates of the two components at an A/B interface. Surface concentration and intensity depth profiles on both… read more here.
Keywords: depth; sputtering depth; depth resolution; preferential sputtering ... See more keywords