Reliability of 3D memories using Orthogonal Latin Square codes
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DOI: 10.1016/j.microrel.2019.03.001
Abstract: Abstract Radiation is a cause of errors in electronics systems, especially on those deployed in space. Memories can suffer from different radiation effects including Single Event Upsets and Multiple Cell Upsets. These effects produce corruption… read more here.
Keywords: latin square; orthogonal latin; reliability memories; square codes ... See more keywords