NCFET-Based 6-T SRAM: Yield Estimation Based on Variation-Aware Sensitivity
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DOI: 10.1109/jeds.2020.2973966
Abstract: The key feature of NCFET (negative capacitance field effect transistor) is its sub-threshold slope (SS) < 60 mV/decade at 300 K. In this work, the n-type NCFET (i.e., pull-down (PD) and passgate (PG) transistor in… read more here.
Keywords: sram yield; variation; based sram; ncfet based ... See more keywords