Optical reflectance imaging reveals interlayer coupling in mechanically stacked MoS2 and WS2 bilayers.
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DOI: 10.1364/oe.473397
Abstract: Optical reflectance imaging is a popular technique for characterizing 2D materials, thanks to its simplicity and speed of data acquisition. The use of this method for studying interlayer phenomena in stacked 2D layers has, however,… read more here.
Keywords: optical reflectance; interlayer coupling; stacked mos2; mos2 ws2 ... See more keywords