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Published in 2017 at "Electrochimica Acta"
DOI: 10.1016/j.electacta.2016.12.028
Abstract: Abstract In-situ surface X-ray diffraction is used to characterize the surface oxides on a Pt(111) surface in 0.1 M HClO 4 . Detailed analysis at two potentials confirms that the surface restructuring in the initial…
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Keywords:
ray diffraction;
surface;
stages 111;
initial stages ... See more keywords