Threshold Voltage Instability After Double Pulse Test Under Different OFF-State Drain Voltages and ON-State Drain Currents in p-GaN Gate AlGaN/GaN HEMT
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DOI: 10.1149/2162-8777/ad49d6
Abstract: This study investigated threshold voltage (VTH) instability in a Schottky p-GaN gate AlGaN/GaN high-electron-mobility transistor (HEMT) by using the double pulse test (DPT) with a 1-µs pulse width in the ON-state and OFF-state. OFF-state drain… read more here.
Keywords: state drain; threshold voltage; gate algan; state ... See more keywords