Trap-state mapping to model GaN transistors dynamic performance
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DOI: 10.1038/s41598-022-05830-7
Abstract: Trapping phenomena degrade the dynamic performance of wide-bandgap transistors. However, the identification of the related traps is challenging, especially in presence of non-ideal defects. In this paper, we propose a novel methodology (trap-state mapping) to… read more here.
Keywords: state mapping; trap state; trap; methodology ... See more keywords