Study on the statistical intensity distribution (SID) of fluorescent nanoparticles in TIRFM measurement
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DOI: 10.1007/s10404-018-2145-2
Abstract: Total internal reflection fluorescence microscopy (TIRFM) based on the evanescent wave provides a powerful imaging tool to measure nanoparticle dynamics near the interfaces in nanofluidic and biophysical systems. The most dramatic advantage of this technique… read more here.
Keywords: statistical intensity; sid; intensity; intensity distribution ... See more keywords