Articles with "stem data" as a keyword



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Image registration of low signal-to-noise cryo-STEM data.

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Published in 2018 at "Ultramicroscopy"

DOI: 10.1016/j.ultramic.2018.04.008

Abstract: Combining multiple fast image acquisitions to mitigate scan noise and drift artifacts has proven essential for picometer precision, quantitative analysis of atomic resolution scanning transmission electron microscopy (STEM) data. For very low signal-to-noise ratio (SNR)… read more here.

Keywords: image; low signal; noise; signal noise ... See more keywords
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Extracting Local Quantitative Atomic-resolution Strain Information from High-precision STEM Data of Supported Nanocatalysts

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Published in 2018 at "Microscopy and Microanalysis"

DOI: 10.1017/s1431927618000752

Abstract: Since the advent of aberration-correction around two decades ago, scanning transmission electron microscopy (STEM) has been providing structural and compositional materials information that was previously unattainable. However, for many applications the quality of the STEM… read more here.

Keywords: information; microscopy; high precision; stem ... See more keywords