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Published in 2018 at "Ultramicroscopy"
DOI: 10.1016/j.ultramic.2018.04.008
Abstract: Combining multiple fast image acquisitions to mitigate scan noise and drift artifacts has proven essential for picometer precision, quantitative analysis of atomic resolution scanning transmission electron microscopy (STEM) data. For very low signal-to-noise ratio (SNR)…
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Keywords:
image;
low signal;
noise;
signal noise ... See more keywords
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Published in 2018 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927618000752
Abstract: Since the advent of aberration-correction around two decades ago, scanning transmission electron microscopy (STEM) has been providing structural and compositional materials information that was previously unattainable. However, for many applications the quality of the STEM…
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Keywords:
information;
microscopy;
high precision;
stem ... See more keywords