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Published in 2019 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927619001065
Abstract: The development of fast acquisition cameras allows for the collection of a series of convergent beam electron diffraction (CBED) patterns at each scanning position during conventional STEM at a speed as fast as s/frame. Thus,…
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Keywords:
field;
differential phase;
stem dataset;
stem ... See more keywords