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Published in 2020 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927620014191
Abstract: Stain density is an important parameter for optimizing the quality of ultrastructural data obtained from several types of 3D electron microscopy techniques, including serial block-face electron microscopy (SBEM), focused ion beam scanning electron microscopy (FIB-SEM)…
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Keywords:
stain density;
stem tomography;
microscopy;