Optimal principal component analysis of STEM XEDS spectrum images
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DOI: 10.1186/s40679-019-0066-0
Abstract: STEM XEDS spectrum images can be drastically denoised by application of the principal component analysis (PCA). This paper looks inside the PCA workflow step by step on an example of a complex semiconductor structure consisting… read more here.
Keywords: principal component; xeds spectrum; spectrum images; stem xeds ... See more keywords