A script‐based method for achieving distortion‐free selected area electron diffraction
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DOI: 10.1002/jemt.24124
Abstract: Electron diffraction patterns obtained on a TEM contain elliptical distortion resulting from column defects. This distortion can be corrected by applying offsets to the objective lens stigmators to cancel distortions occurring further down the column.… read more here.
Keywords: distortion; electron diffraction; diffraction; stigmator values ... See more keywords