Anisotropically biaxial strain in non-polar (112–0) plane InxGa1−xN/GaN layers investigated by X-ray reciprocal space mapping
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DOI: 10.1038/s41598-017-04854-8
Abstract: In this study, the indium composition x as well as the anisotropically biaxial strain in non-polar a-plane InxGa1−xN on GaN is studied by X-ray diffraction (XRD) analysis. In accordance with XRD reciprocal lattice space mapping,… read more here.
Keywords: strain non; biaxial strain; non polar; strain ... See more keywords