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Published in 2020 at "Physical Review Materials"
DOI: 10.1103/physrevmaterials.4.064416
Abstract: An in-depth structural study of a 23-nm-thick ${\mathrm{BiFeO}}_{3}$ film grown on orthorhombic ${\mathrm{NdScO}}_{3}\phantom{\rule{4pt}{0ex}}{\left(110\right)}_{O}$ substrates demonstrates the presence of a mixed phases. Atomic resolution scanning transmission electron microscopy measurements reveal an out-of-plane stripe domain structure typical…
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Keywords:
structural photoelectric;
strained bifeo3;
tensile strained;
properties tensile ... See more keywords