STABLE: Stress-Aware Boolean Matching to Mitigate BTI-Induced SNM Reduction in SRAM-Based FPGAs
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DOI: 10.1109/tc.2017.2725952
Abstract: Biased-Temperature-Instability (BTI) aging mechanism reduces Static-Noise-Margin (SNM) of SRAM cells. This leads to a higher Soft-Error-Rate (SER), lower reliability, and lower SRAMs’ stability in FPGAs. SNM partially improves by leveraging the recovery phase of BTI… read more here.
Keywords: bti; stress aware; induced snm; snm reduction ... See more keywords