Stress Buildup Upon Crystallization of GeTe Thin Films: Curvature Measurements and Modelling
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DOI: 10.3390/nano10061247
Abstract: Phase change materials are attractive materials for non-volatile memories because of their ability to switch reversibly between an amorphous and a crystal phase. The volume change upon crystallization induces mechanical stress that needs to be… read more here.
Keywords: stress buildup; crystallization; curvature measurements; upon crystallization ... See more keywords