Neutron Irradiation Effects on the Electrical Properties of Previously Electrically Stressed AlInN/GaN HEMTs
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DOI: 10.1109/tns.2019.2908055
Abstract: This paper analyses the neutron irradiation impact on the electrical performances of unstressed, ON-state, OFF-state, and negative gate bias (NGB) stressed AlInN/GaN HEMTs. These irradiations have resulted in the creation of electron traps that are… read more here.
Keywords: gan hemts; alinn gan; stressed alinn; neutron irradiation ... See more keywords