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Published in 2018 at "Physical Review Materials"
DOI: 10.1103/physrevmaterials.2.051402
Abstract: Fe3Si/Ge(Fe,Si)/Fe3Si thin-film stacks were grown by a combination of molecular beam epitaxy and solidphase epitaxy (Ge on Fe3Si). The stacks were analyzed using electron microscopy, electron diffraction, and synchrotron x-ray diffraction. The Ge(Fe,Si) films crystallize…
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Keywords:
structure fege2;
fe3si;
solid phase;
structure ... See more keywords