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Published in 2020 at "Journal of Physics and Chemistry of Solids"
DOI: 10.1016/j.jpcs.2020.109844
Abstract: Abstract In(1-x)Al(x)Sb films were deposited on amorphous SiO2 by magnetron sputtering with four different In/Al concentration ratios and the local and extended atomic structure were investigated through extended x-ray absorption fine structure (EXAFS) spectroscopy and…
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Keywords:
atomic structure;
local extended;
extended atomic;
strained polycrystalline ... See more keywords