XPS Studies of LSCF Interfaces after Cell Testing
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DOI: 10.1155/2018/7561561
Abstract: The motivation of this investigation is to explore the possibility of using the depth profile capability of XPS to study interfaces after SOFC button cell testing. The literature uses XPS to study various cathode materials… read more here.
Keywords: xps studies; interfaces cell; studies lscf; lscf interfaces ... See more keywords