X-Ray Study of the Superstructure in Heavily Doped Porous Indium Phosphide
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DOI: 10.1134/s1063782618010074
Abstract: An indium-phosphide InP sample subjected to the pore-generation procedure and then doped with S atoms is studied by the methods of X-ray diffraction analysis (XRD) and small-angle X-ray scattering (SAXS) (with CuKα1-radiation). The XRD data… read more here.
Keywords: sample; indium phosphide; ray study; study superstructure ... See more keywords