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Published in 2025 at "Applied Physics Letters"
DOI: 10.1063/5.0268227
Abstract: The controlled trapping of micro- to submicrometer-sized particles is crucial for fundamental research, precision metrology, and applied technologies. However, existing loading methods often rely on stochastic processes, leading to low reproducibility and limited scalability. Here,…
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Keywords:
optically assisted;
stylus trap;
micro;
ambient conditions ... See more keywords