Robust Preparation of Sub‐20‐nm‐Thin Lamellae for Aberration‐Corrected Electron Microscopy
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DOI: 10.1002/smtd.202301425
Abstract: Aberration‐corrected scanning transmission electron microscopy (STEM) has been advancing resolution, sensitivity, and microanalysis due to the intense demands of atomic‐level microstructural investigations. Recent STEM technologies require preparing a thin lamella whose thickness is ideally below… read more here.
Keywords: methodology; electron microscopy; lamella; thickness ... See more keywords
Highly Sensitive Bulk Silicon Chemical Sensors with Sub-5 nm Thin Charge Inversion Layers.
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DOI: 10.1021/acsnano.8b00580
Abstract: There is an increasing demand for mass-producible, low-power gas sensors in a wide variety of industrial and consumer applications. Here, we report chemical-sensitive field-effect-transistors (CS-FETs) based on bulk silicon wafers, wherein an electrostatically confined sub-5… read more here.
Keywords: sub thin; thin charge; bulk silicon; charge inversion ... See more keywords