Detection of Subsurface, Nanometer‐Scale Crystallographic Defects by Nonlinear Light Scattering and Localization
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DOI: 10.1002/adom.202002252
Abstract: Heteroepitaxial crystalline films underlie many electronic and optical technologies but are prone to forming defects at their heterointerfaces. Atomic‐scale defects such as threading dislocations that propagate into a film impede the flow of charge carriers… read more here.
Keywords: detection subsurface; subsurface nanometer; subsurface; scattering localization ... See more keywords