Detailed characterization of supported eutectic droplets using photoemission electron microscopy
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DOI: 10.1103/physrevmaterials.5.105601
Abstract: Pt-Ge eutectic alloy droplets are scrutinized by microscopic analysis of electrons excited by 4.9-eV photons. Using only the work function and contact angle as fitting parameters, we determine the exact droplet shape that reproduces the… read more here.
Keywords: supported eutectic; characterization supported; microscopy; detailed characterization ... See more keywords