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Published in 2019 at "Solid-State Electronics"
DOI: 10.1016/j.sse.2018.11.004
Abstract: Abstract Due to the two-terminal structure, non-destructive read and high integrable density, resistive switching random access memory (RRAM) has attracted much attention for its potential applications in semiconductor industry. Unfortunately, the unexpected failure behaviour is…
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Keywords:
memory;
resistive switching;
zno heterostructure;
cds zno ... See more keywords