A comparative study on electrical characteristics of Ni/n-Si and Ni/p-Si Schottky diodes with Pinus Sylvestris Resin interfacial layer in dark and under illumination at room temperature
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DOI: 10.1016/j.optmat.2021.111380
Abstract: Abstract In this study, we evaluated the potential use of the Pinus Sylvestris Resin (PSR) organic material in the metal/interface layer/semiconductor Schottky diode (SD) structure as an interface layer. For this purpose, PSR/n-Si and PSR/p-Si… read more here.
Keywords: psr; sylvestris resin; layer; pinus sylvestris ... See more keywords