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Published in 2019 at "IEEE Transactions on Electron Devices"
DOI: 10.1109/ted.2018.2881972
Abstract: This paper proposes a synaptic device based on charge-trap flash memory that has good CMOS compatibility and superior reliability characteristics compared with other synaptic devices. Using hot-electron injection and hot-hole injection, we designed operation methods…
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Keywords:
flash memory;
charge trap;
stacked synapse;
trap flash ... See more keywords